Epsilometer -介电材料测量与分析

Epsilometer solution for measuring the dielectric properties of materials measures dielectric substrate materials at frequencies from 3MHz up to 6GHz and can accommodate sheet specimens 0.3 to 3mm thick.

用于测量材料介电特性的Epsilometer解决方案可测量频率为3MHz至6GHz的介质基板材料，并可容纳厚度为0.3至3mm的薄板样品。

This solution uses a new methodology, according to Dr. John Schultz of Compass Technology, “Unlike previous dielectric analysis technologies, this new method uses computational electromagnetic modeling to invert the dielectric permittivity and loss. This represents a significant advance over conventional methods, which use analytical approximations and are limited to frequencies below 1 GHz.”

The Epsilometer solution includes R60 VNA with software, measurement fixture, Epsilometer software, and calibration sample.

Epsilometer解决方案包括R60 VNA，软件，测量夹具，Epsilometer软件和校准样品。

• 频率范围：<10MHz-6GHz

• 阻抗：50Ω

• 板厚：0.3-3mm

• 填充数据库的介电常数为25

Epsilometer can be used in design and manufacturing of microwave circuit materials, antenna radomes, antenna substrates, packaging for wireless devices – 4G/LTE, WiFi, Bluetooth, 5G, IoT, etc. – and many other applications.

Epsilometer可用于设计和制造微波电路材料、天线罩、天线基板、4G/LTE、WiFi、蓝牙、5G、物联网等无线设备的包装以及许多其他应用。

The Epsilometer solution has been developed in collaboration with Compass Technology, a leading provider of material measurement solutions and systems.